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1

Solution method for nonlinear problems with multiple critical points

YANG, YEONG-BIN, SHIEH, MING-SHAN

Journal:

Year:

1990

Language:

english

File:

PDF, 693 KB

english, 1990

2

Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Chih-Yang Chen, Jam-Wem Lee, Shen-De Wang, Ming-Shan Shieh, Po-Hao Lee, Wei-Cheng Chen, Hsiao-Yi Lin, Kuan-Lin Yeh, Tan-Fu Lei

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 1.05 MB

english, 2006

3

Plasma-Induced Damage on the Performance and Reliability of Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Chen, Chih-Yang, Wang, Shen-De, Shieh, Ming-Shan, Chen, Wei-Cheng, Lin, Hsiao-Yi, Yeh, Kuan-Lin, Lee, Jam-Wem, Lei, Tan-Fu

Journal:

Journal of The Electrochemical Society

Year:

2007

Language:

english

File:

PDF, 1.07 MB

english, 2007

4

A novel dynamic threshold Voltage MOSFET (DTMOS) using heterostructure channel of Si/sub 1-y/C/sub y/ interlayer

Ming-Shan Shieh,, Pang-Shiu Chen,, Tsai, M.-J., Lei, T.F.

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 129 KB

english, 2005

5

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Effect of Chemical Mechanical Polish Process on Low-Temperature Poly-Sige Thin-Film Transistors

Shieh, Ming-shan, Chen, Chih-yang, Hsu, Yuan-jiun, Wang, Shen-de, Lei, Tan-fu

Year:

2006

Language:

english

File:

PDF, 280 KB

english, 2006

6

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Process Induced Instability and Reliability Issues in Low Temperature Poly-Si Thin Film Transistors

Chen, Chih-yang, Wang, Shen-de, Shieh, Ming-shan, Chen, Wei-cheng, Li, Hsiao-yi, Yeh, Kuan-lin, Lee, Jam-wen, Lei, Tan-fu

Year:

2006

Language:

english

File:

PDF, 208 KB

english, 2006

7

Electrical Characteristics and Reliability of Multi-channel Polycrystalline Silicon Thin-Film Transistors

Shieh, Ming-Shan, Sang, Jen-Yi, Chen, Chih-Yang, Wang, Shen-De, Lei, Tan-Fu

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 253 KB

english, 2006

8

The CMP Process and Cleaning Solution for Planarization of Strain-Relaxed SiGe Virtual Substrates in MOSFET Applications

Shieh, Ming-Shan, Chen, Pang-Shiu, Tsai, M.-J., Lei, Tan Fu

Journal:

Journal of The Electrochemical Society

Year:

2006

Language:

english

File:

PDF, 1.02 MB

english, 2006

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